kvmmatter.blogg.se - Manual of ultraflex teradyne tester

It also increases maximum data rate to 10.7Gbps.

UltraSerial10G - The UltraSerial10G is a next generation, high speed serial option supporting up to 20 bidirectional ports which more than doubles the density of previous generation instrumentation.

It also has new features including same-cycle source synchronous capability for high speed DDR test, hardware-based Protocol Aware capability and up to 18 time domains to enable Concurrent Test of complex devices.

UltraPin1600 - The UltraPin1600 is the third generation digital option for UltraFLEX, which doubles instrument pin count to 256 pins per slot and increases maximum data rate to 1.6Gbps.

It also features dual-band source and capture per pin, on-the-fly waveform interpolation and decimation, and real-time data transfer to up to 16 independent DSP processing engines for optimum performance and throughput.

UltraPAC80 - The UltraPAC80 is a high density, wideband AC Waveform source and capture option that supports up to eight source and eight capture channels, with coverage up to 80MHz.The new instruments for the UltraFLEX Test System include: All of the instruments are currently in use by Teradyne customers. New features also enable the testing of emerging SOC technology, including higher external data rates and new packaging technologies such as 3D System-In-Package. These instruments increase the system's scalability and offer customers solutions to lower cost of test and improve time to market. announces the availability of the UltraPAC80, UltraPin1600, UltraSerial10G and UltraVI80 instruments for the UltraFLEX® test system. 6° of freedom plus ± 2° of compliance in theta, tumble, twist and swing.Teradyne, Inc.Teradyne provides “one-stop-shop convenience” test cell solutions with a large installed-base worldwide. It has the smallest form factor reducing cost and floor space requirements.

"Integrated" manipulator is also “universal”, allowing the tester to dock on any DUT position (up, down or vertical) providing flexibility in both final test and wafer probe environments. UltraFLEX HC RAM Integrated Manipulator Left Swing: 979-236-50, Right Swing: 979-236-51 The UltraFLEX HC RAM Manipulator is an intregrated manipulator for the UltraFLEX 36-slot tester system.